CBIT16E01_CANDO5 4-Wire Interface + Test Circuits
Technology: AMS 0.35μm 2P4M CMOS (H35B4S1)
Silicon Area: 4mm × 3.75mm
Description: Test circuits for CANDO optrode including 4-wire communication sub-system, non-volatile memory, and test structures for long-term reliability testing.
Designers: Dorian Haci, Federico Mazza, Sara Ghoreishizadeh, Yan Liu, Timothy Constandinou
Tape-out: May 2016
- Ghoreishizadeh S, Haci D, Liu Y, Constandinou T, A 4-wire interface SoC for shared multi-implant power transfer and full-duplex communication, IEEE Latin American symposium on Circuits and Systems (LASCAS), Pages: 49-52